Browsing Department of Computer Science & Engineering by Author "Biswal, Pradeep Kumar"

Browsing Department of Computer Science & Engineering by Author "Biswal, Pradeep Kumar"

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  • Biswal, Pradeep Kumar (2017)
    The rapid increase in complexity of VLSI circuits with the advent of Deep Sub-Micron (DSM) technology causes development of faults during their normal operation. Such faults cannot be detected by off-line test or Built-In-Self- ...

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